Temperature dependence of the electrical transport properties in few-layer graphene interconnects

• Main Authors: Lew, Wen Siang, Wang, Qi Jie, Liu, Yanping, Liu, Zongwen
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2015
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electric power
• Online Access: https://hdl.handle.net/10356/106646; http://hdl.handle.net/10220/24994
• Institution: Nanyang Technological University

We report a systematic investigation of the temperature dependence of electrical resistance behaviours in tri- and four-layer graphene interconnects. Nonlinear current–voltage characteristics were observed at different temperatures, which are attributed to the heating effect. With the resistance curve derivative analysis method, our experimental results suggest that Coulomb interactions play an essential role in our devices. The room temperature measurements further indicate that the graphene layers exhibit the characteristics of semiconductors mainly due to the Coulomb scattering effects. By combining the Coulomb and short-range scattering theory, we derive an analytical model to explain the temperature dependence of the resistance, which agrees well with the experimental results.