Contrast and Raman spectroscopy study of single- and few-layered charge density wave material : 2H-TaSe2

• المؤلفون الرئيسيون: Hajiyev, Parviz, Cong, Chunxiao, Qiu, Caiyu, Yu, Ting
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/106750; http://hdl.handle.net/10220/16637

In this article, we report the first successful preparation of single- and few-layers of tantalum diselenide (2H-TaSe2) by mechanical exfoliation technique. Number of layers is confirmed by white light contrast spectroscopy and atomic force microscopy (AFM). Vibrational properties of the atomically...