Contrast and Raman spectroscopy study of single- and few-layered charge density wave material : 2H-TaSe2

• Main Authors: Hajiyev, Parviz, Cong, Chunxiao, Qiu, Caiyu, Yu, Ting
• Other Authors: School of Physical and Mathematical Sciences
• Format: Article
• Language: English
• Published: 2013
• Online Access: https://hdl.handle.net/10356/106750; http://hdl.handle.net/10220/16637
• Institution: Nanyang Technological University

In this article, we report the first successful preparation of single- and few-layers of tantalum diselenide (2H-TaSe2) by mechanical exfoliation technique. Number of layers is confirmed by white light contrast spectroscopy and atomic force microscopy (AFM). Vibrational properties of the atomically...