Alternative configuration scheme for signal amplification with scanning ion conductance microscopy

Alternative configuration scheme for signal amplification with scanning ion conductance microscopy

Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance betwe...

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Bibliographic Details
Main Authors: Kim, Joonhui, Kim, Seong-Oh, Cho, Nam-Joon
Other Authors: School of Chemical and Biomedical Engineering
Format: Article
Language:English
Published: 2015
Subjects:
DRNTU::Engineering::Materials::Compositional materials science
Online Access:https://hdl.handle.net/10356/107021
http://hdl.handle.net/10220/25223
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Institution: Nanyang Technological University
Language: English

Internet

https://hdl.handle.net/10356/107021
http://hdl.handle.net/10220/25223

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