Alternative configuration scheme for signal amplification with scanning ion conductance microscopy
Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance betwe...
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/107021 http://hdl.handle.net/10220/25223 |
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| Institution: | Nanyang Technological University |
| Language: | English |