Characterization of wafers by V(Z) curve technique of scanning acoustic microscopy

• المؤلف الرئيسي: Loh, Edwin Jin Wee.
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2009
• الموضوعات: DRNTU::Engineering::Materials::Material testing and characterization
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/17136
• المؤسسة: Nanyang Technological University

The report presents the work performed on the evaluation of Young’s Modulus using the V(z) curve technique. The background of V(z) curve technique in determining the material properties non-destructively is introduced. In order for readers to understand the procedures undertaken for the project, a c...