Characterization of wafers by V(Z) curve technique of scanning acoustic microscopy

• Main Author: Loh, Edwin Jin Wee.
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Final Year Project
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Materials::Material testing and characterization
• Online Access: http://hdl.handle.net/10356/17136
• Institution: Nanyang Technological University

The report presents the work performed on the evaluation of Young’s Modulus using the V(z) curve technique. The background of V(z) curve technique in determining the material properties non-destructively is introduced. In order for readers to understand the procedures undertaken for the project, a c...