Van der Waals negative capacitance transistors

The Boltzmann distribution of electrons sets a fundamental barrier to lowering energy consumption in metal-oxide-semiconductor field-effect transistors (MOSFETs). Negative capacitance FET (NC-FET), as an emerging FET architecture, is promising to overcome this thermionic limit and build ultra-low-po...

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Main Authors: Wang, Xiaowei, Yu, Peng, Lei, Zhendong, Zhu, Chao, Cao, Xun, Liu, Fucai, You, Lu, Zeng, Qingsheng, Deng, Ya, Zhou, Jiadong, Fu, Qundong, Wang, Junling, Huang, Yizhong, Liu, Zheng
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2019
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Online Access:https://hdl.handle.net/10356/107516
http://hdl.handle.net/10220/49725
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1075162023-07-14T15:58:24Z Van der Waals negative capacitance transistors Wang, Xiaowei Yu, Peng Lei, Zhendong Zhu, Chao Cao, Xun Liu, Fucai You, Lu Zeng, Qingsheng Deng, Ya Zhu, Chao Zhou, Jiadong Fu, Qundong Wang, Junling Huang, Yizhong Liu, Zheng School of Electrical and Electronic Engineering School of Materials Science & Engineering CINTRA CNRS/NTU/Thales Centre for Micro-/Nano-electronics (NOVITAS) Environmental Chemistry and Materials Centre Nanyang Environment and Water Research Institute Research Techno Plaza Electronic Devices Two-dimensional Materials Engineering::Electrical and electronic engineering The Boltzmann distribution of electrons sets a fundamental barrier to lowering energy consumption in metal-oxide-semiconductor field-effect transistors (MOSFETs). Negative capacitance FET (NC-FET), as an emerging FET architecture, is promising to overcome this thermionic limit and build ultra-low-power consuming electronics. Here, we demonstrate steep-slope NC-FETs based on two-dimensional molybdenum disulfide and CuInP2S6 (CIPS) van der Waals (vdW) heterostructure. The vdW NC-FET provides an average subthreshold swing (SS) less than the Boltzmann’s limit for over seven decades of drain current, with a minimum SS of 28 mV dec−1. Negligible hysteresis is achieved in NC-FETs with the thickness of CIPS less than 20 nm. A voltage gain of 24 is measured for vdW NC-FET logic inverter. Flexible vdW NC-FET is further demonstrated with sub-60 mV dec−1 switching characteristics under the bending radius down to 3.8 mm. These results demonstrate the great potential of vdW NC-FET for ultra-low-power and flexible applications. NRF (Natl Research Foundation, S’pore) ASTAR (Agency for Sci., Tech. and Research, S’pore) MOE (Min. of Education, S’pore) Published version 2019-08-21T04:12:50Z 2019-12-06T22:33:01Z 2019-08-21T04:12:50Z 2019-12-06T22:33:01Z 2019 Journal Article Wang, X., Yu, P., Lei, Z., Zhu, C., Cao, X., Liu, F., . . . Liu, Z. (2019). Van der Waals negative capacitance transistors. Nature Communications, 10(1), 3037-. doi:10.1038/s41467-019-10738-4 https://hdl.handle.net/10356/107516 http://hdl.handle.net/10220/49725 10.1038/s41467-019-10738-4 en Nature Communications © 2019 The Author(s). Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. 8 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Electronic Devices
Two-dimensional Materials
Engineering::Electrical and electronic engineering
spellingShingle Electronic Devices
Two-dimensional Materials
Engineering::Electrical and electronic engineering
Wang, Xiaowei
Yu, Peng
Lei, Zhendong
Zhu, Chao
Cao, Xun
Liu, Fucai
You, Lu
Zeng, Qingsheng
Deng, Ya
Zhu, Chao
Zhou, Jiadong
Fu, Qundong
Wang, Junling
Huang, Yizhong
Liu, Zheng
Van der Waals negative capacitance transistors
description The Boltzmann distribution of electrons sets a fundamental barrier to lowering energy consumption in metal-oxide-semiconductor field-effect transistors (MOSFETs). Negative capacitance FET (NC-FET), as an emerging FET architecture, is promising to overcome this thermionic limit and build ultra-low-power consuming electronics. Here, we demonstrate steep-slope NC-FETs based on two-dimensional molybdenum disulfide and CuInP2S6 (CIPS) van der Waals (vdW) heterostructure. The vdW NC-FET provides an average subthreshold swing (SS) less than the Boltzmann’s limit for over seven decades of drain current, with a minimum SS of 28 mV dec−1. Negligible hysteresis is achieved in NC-FETs with the thickness of CIPS less than 20 nm. A voltage gain of 24 is measured for vdW NC-FET logic inverter. Flexible vdW NC-FET is further demonstrated with sub-60 mV dec−1 switching characteristics under the bending radius down to 3.8 mm. These results demonstrate the great potential of vdW NC-FET for ultra-low-power and flexible applications.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Wang, Xiaowei
Yu, Peng
Lei, Zhendong
Zhu, Chao
Cao, Xun
Liu, Fucai
You, Lu
Zeng, Qingsheng
Deng, Ya
Zhu, Chao
Zhou, Jiadong
Fu, Qundong
Wang, Junling
Huang, Yizhong
Liu, Zheng
format Article
author Wang, Xiaowei
Yu, Peng
Lei, Zhendong
Zhu, Chao
Cao, Xun
Liu, Fucai
You, Lu
Zeng, Qingsheng
Deng, Ya
Zhu, Chao
Zhou, Jiadong
Fu, Qundong
Wang, Junling
Huang, Yizhong
Liu, Zheng
author_sort Wang, Xiaowei
title Van der Waals negative capacitance transistors
title_short Van der Waals negative capacitance transistors
title_full Van der Waals negative capacitance transistors
title_fullStr Van der Waals negative capacitance transistors
title_full_unstemmed Van der Waals negative capacitance transistors
title_sort van der waals negative capacitance transistors
publishDate 2019
url https://hdl.handle.net/10356/107516
http://hdl.handle.net/10220/49725
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