An on-line statistical process control application for wire bond

• المؤلف الرئيسي: Liu, Hann Wen.
• مؤلفون آخرون: De Souza, Robert
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Systems engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/13409

Implementing Computer Integrated Manufacturing (CIM) systems in semiconductor manufacturing can lead to better quality, increase production output and flexibility, through better utilization of automation, communications and other management systems. As Computer Integrated Manufacturing (CIM) Sys...