An on-line statistical process control application for wire bond

Implementing Computer Integrated Manufacturing (CIM) systems in semiconductor manufacturing can lead to better quality, increase production output and flexibility, through better utilization of automation, communications and other management systems. As Computer Integrated Manufacturing (CIM) Sys...

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Bibliographic Details
Main Author: Liu, Hann Wen.
Other Authors: De Souza, Robert
Format: Theses and Dissertations
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/13409
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Institution: Nanyang Technological University
Language: English
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