Study on the semiconductor wafer fabrication performance improvement based on job release control

• 主要作者: Andy Darwin Kasan Hidayat
• 其他作者: Sivakumar, Appa Iyer
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2008
• 主題: DRNTU::Engineering::Mechanical engineering::Control engineering; DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• 在線閱讀: http://hdl.handle.net/10356/13610

Mean cycle time, standard deviation of the cycle time, WIP level, throughput, and due date performance are the main performance measurements of factory. In this project, the investigation of the production control will be conducted. The extension of WIPLOAD control mechanism will be adopted to study...