Study on the semiconductor wafer fabrication performance improvement based on job release control

Mean cycle time, standard deviation of the cycle time, WIP level, throughput, and due date performance are the main performance measurements of factory. In this project, the investigation of the production control will be conducted. The extension of WIPLOAD control mechanism will be adopted to study...

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Bibliographic Details
Main Author: Andy Darwin Kasan Hidayat
Other Authors: Sivakumar, Appa Iyer
Format: Theses and Dissertations
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/13610
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Institution: Nanyang Technological University
Language: English