Study on the semiconductor wafer fabrication performance improvement based on job release control

• المؤلف الرئيسي: Andy Darwin Kasan Hidayat
• مؤلفون آخرون: Sivakumar, Appa Iyer
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Mechanical engineering::Control engineering; DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/13610

Mean cycle time, standard deviation of the cycle time, WIP level, throughput, and due date performance are the main performance measurements of factory. In this project, the investigation of the production control will be conducted. The extension of WIPLOAD control mechanism will be adopted to study...