Unsupervised surface defect detection using deep autoencoders and data augmentation

• Main Authors: Abdul Mujeeb, Dai, Wenting, Erdt, Marius, Sourin, Alexei
• Other Authors: School of Computer Science and Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2020
• Subjects: Engineering::Computer science and engineering; Defect Detection; Automatic Optical Inspection
• Online Access: https://hdl.handle.net/10356/137972
• Institution: Nanyang Technological University

Surface level defect detection, such as detecting missing components, misalignments and physical damages, is an important step in any manufacturing process. In this paper, similarity matching techniques for manufacturing defect detection are discussed. We are proposing an algorithm which detects surface level defects without relying on the availability of defect samples for training. Furthermore, we are also proposing a method which works when only one or a few reference images are available. It implements a deep autoencoder network and trains input reference image(s) along with various copies automatically generated by data augmentation. The trained network is then able to generate a descriptor-a unique signature of the reference image. After training, a test image of the same product is sent to the trained network to generate a test image descriptor. By matching the reference and test descriptors, a similarity score is generated which indicates if a defect is found. Our experiments show that this approach is more generic than traditional hand-engineered feature extraction methods and it can be applied to detect multiple type of defects.