One class based feature learning approach for defect detection using deep autoencoders

• Main Authors: Abdul Mujeeb, Dai, Wenting, Erdt, Marius, Sourin, Alexei
• Other Authors: School of Computer Science and Engineering
• Format: Article
• Language: English
• Published: 2020
• Subjects: Engineering::Computer science and engineering; Automated Manufacturing Systems; Automatic Optical Inspection
• Online Access: https://hdl.handle.net/10356/137979
• Institution: Nanyang Technological University

Detecting defects is an integral part of any manufacturing process. Most works still utilize traditional image processing algorithms to detect defects owing to the complexity and variety of products and manufacturing environments. In this paper, we propose an approach based on deep learning which us...