Sharable and individual multi-view metric learning

• المؤلفون الرئيسيون: Hu, Junlin, Lu, Jiwen, Tan, Yap-Peng
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Electrical and electronic engineering; Metric Learning; Deep Learning
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/139872
• المؤسسة: Nanyang Technological University

This paper presents a sharable and individual multi-view metric learning (MvML) approach for visual recognition. Unlike conventional metric leaning methods which learn a distance metric on either a single type of feature representation or a concatenated representation of multiple types of features,...