Local large-margin multi-metric learning for face and kinship verification

Metric learning has attracted wide attention in face and kinship verification, and a number of such algorithms have been presented over the past few years. However, most existing metric learning methods learn only one Mahalanobis distance metric from a single feature representation for each face ima...

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Bibliographic Details
Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap-Peng, Yuan, Junsong, Zhou, Jie
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2020
Subjects:
Online Access:https://hdl.handle.net/10356/142210
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Institution: Nanyang Technological University
Language: English