Local large-margin multi-metric learning for face and kinship verification

• المؤلفون الرئيسيون: Hu, Junlin, Lu, Jiwen, Tan, Yap-Peng, Yuan, Junsong, Zhou, Jie
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Electrical and electronic engineering; Local Metric Learning; Multi-metric Learning
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/142210
• المؤسسة: Nanyang Technological University

Metric learning has attracted wide attention in face and kinship verification, and a number of such algorithms have been presented over the past few years. However, most existing metric learning methods learn only one Mahalanobis distance metric from a single feature representation for each face ima...