Windowed Fourier ridges for demodulation of carrier fringe patterns with nonlinearity : a theoretical analysis

Accurately extracting phase or phase derivative is the most important requirement in optical metrology. However, in practice, there are many error sources, among which nonlinear distortion in fringe patterns is often encountered. Several techniques have been proposed over time to remove the nonlinea...

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Bibliographic Details
Main Authors: Agarwal, Nimisha, Wang, Chenxing, Qian, Kemao
Other Authors: School of Computer Science and Engineering
Format: Article
Language:English
Published: 2020
Subjects:
Online Access:https://hdl.handle.net/10356/140095
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Institution: Nanyang Technological University
Language: English