Windowed Fourier ridges for demodulation of carrier fringe patterns with nonlinearity : a theoretical analysis
Accurately extracting phase or phase derivative is the most important requirement in optical metrology. However, in practice, there are many error sources, among which nonlinear distortion in fringe patterns is often encountered. Several techniques have been proposed over time to remove the nonlinea...
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| Main Authors: | , , |
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| 其他作者: | |
| 格式: | Article |
| 語言: | English |
| 出版: |
2020
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| 在線閱讀: | https://hdl.handle.net/10356/140095 |
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| 機構: | Nanyang Technological University |
| 語言: | English |