Defects detection using machine learning in condition monitoring

• Main Author: Tan, Jian Jia
• Other Authors: See Kye Yak
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2020
• Subjects: Engineering::Electrical and electronic engineering::Computer hardware, software and systems
• Online Access: https://hdl.handle.net/10356/140159
• Institution: Nanyang Technological University

This final year project aims to make use of machine learning technique in condition monitoring for defects detection on the third rail. The machine learning model taken into consideration is the Support Vector Machine. The critical features were extracted from the data collected. This report analyse...