Employee profiling via aspect-based sentiment and network for insider threats detection

• Main Authors: Soh, Charlie, Yu, Sicheng, Narayanan, Annamalai, Duraisamy, Santhiya, Chen, Lihui
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2020
• 主題: Engineering::Electrical and electronic engineering; Insider Threat; Aspect-based Sentiment Analysis
• 在線閱讀: https://hdl.handle.net/10356/143916
• 機構: Nanyang Technological University

Historically, the harm caused by insiders has proven to be one of the greatest concerns for any organization. As such, it has received considerable attention from both the industrial and research communities. Existing works mainly focused on modeling the employees’ normal biometric behavior (e.g., h...