Label-free deeply subwavelength optical microscopy

• Main Authors: Pu, T., Ou, J. Y., Papasimakis, N., Zheludev, Nikolay I.
• Other Authors: School of Physical and Mathematical Sciences
• Format: Article
• Language: English
• Published: 2020
• Subjects: Science::Physics; Deep Learning; Optical Microscopy
• Online Access: https://hdl.handle.net/10356/143948
• Institution: Nanyang Technological University

We report the experimental demonstration of deeply subwavelength far-field optical microscopy of unlabeled samples. We beat the ∼λ/2 diffraction limit of conventional optical microscopy several times over by recording the intensity pattern of coherent light scattered from the object into the far-fie...