Label-free deeply subwavelength optical microscopy
We report the experimental demonstration of deeply subwavelength far-field optical microscopy of unlabeled samples. We beat the ∼λ/2 diffraction limit of conventional optical microscopy several times over by recording the intensity pattern of coherent light scattered from the object into the far-fie...
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| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2020
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/143948 |
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| Institution: | Nanyang Technological University |
| Language: | English |