Feasibility of modulated optical deflection sensing in atomic force microscopy

Feasibility of modulated optical deflection sensing in atomic force microscopy

10.1117/12.621749

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Bibliographic Details
Main Authors: Ng, T.W., Lee, W.S., Sasaki, O.
Other Authors: BACHELOR OF TECHNOLOGY PROGRAMME
Format: Conference or Workshop Item
Published: 2014
Subjects:
Atomic force microscopy
Chaos
Operational amplifiers
Optical deflection
Photodiode
Signals
Online Access:http://scholarbank.nus.edu.sg/handle/10635/75281
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/75281

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