Feasibility of modulated optical deflection sensing in atomic force microscopy
10.1117/12.621749
Saved in:
Main Authors: | Ng, T.W., Lee, W.S., Sasaki, O. |
---|---|
Other Authors: | BACHELOR OF TECHNOLOGY PROGRAMME |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/75281 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Resolution analysis of atomic force microscopy using temporal phase modulation interferometry
by: Ng, T.W., et al.
Published: (2014) -
Nanoscale materials patterning and engineering by atomic force microscopy nanolithography
by: Xie, X.N., et al.
Published: (2014) -
Resolving the Pinning Force of Nanobubbles with Optical Microscopy
by: Tan, Beng Hau, et al.
Published: (2017) -
Atomic and magnetic force microscopy imaging of thin-film recording heads
by: Chim, W.K.
Published: (2014) -
Unveiling the layered structure of sulfobetaine polymer brushes through bimodal atomic force microscopy
by: Mondarte, Evan Angelo Quimada, et al.
Published: (2023)