Feasibility of modulated optical deflection sensing in atomic force microscopy

10.1117/12.621749

Saved in:

Bibliographic Details
Main Authors:	Ng, T.W., Lee, W.S., Sasaki, O.
Other Authors:	BACHELOR OF TECHNOLOGY PROGRAMME
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Atomic force microscopy Chaos Operational amplifiers Optical deflection Photodiode Signals
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/75281
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-75281
record_format	dspace
spelling	sg-nus-scholar.10635-752812023-10-26T07:25:25Z Feasibility of modulated optical deflection sensing in atomic force microscopy Ng, T.W. Lee, W.S. Sasaki, O. BACHELOR OF TECHNOLOGY PROGRAMME Atomic force microscopy Chaos Operational amplifiers Optical deflection Photodiode Signals 10.1117/12.621749 Proceedings of SPIE - The International Society for Optical Engineering 5852 PART II 621-626 PSISD 2014-06-19T09:49:24Z 2014-06-19T09:49:24Z 2005 Conference Paper Ng, T.W., Lee, W.S., Sasaki, O. (2005). Feasibility of modulated optical deflection sensing in atomic force microscopy. Proceedings of SPIE - The International Society for Optical Engineering 5852 PART II : 621-626. ScholarBank@NUS Repository. https://doi.org/10.1117/12.621749 0277786X http://scholarbank.nus.edu.sg/handle/10635/75281 000229932000099 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Atomic force microscopy Chaos Operational amplifiers Optical deflection Photodiode Signals
spellingShingle	Atomic force microscopy Chaos Operational amplifiers Optical deflection Photodiode Signals Ng, T.W. Lee, W.S. Sasaki, O. Feasibility of modulated optical deflection sensing in atomic force microscopy
description	10.1117/12.621749
author2	BACHELOR OF TECHNOLOGY PROGRAMME
author_facet	BACHELOR OF TECHNOLOGY PROGRAMME Ng, T.W. Lee, W.S. Sasaki, O.
format	Conference or Workshop Item
author	Ng, T.W. Lee, W.S. Sasaki, O.
author_sort	Ng, T.W.
title	Feasibility of modulated optical deflection sensing in atomic force microscopy
title_short	Feasibility of modulated optical deflection sensing in atomic force microscopy
title_full	Feasibility of modulated optical deflection sensing in atomic force microscopy
title_fullStr	Feasibility of modulated optical deflection sensing in atomic force microscopy
title_full_unstemmed	Feasibility of modulated optical deflection sensing in atomic force microscopy
title_sort	feasibility of modulated optical deflection sensing in atomic force microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/75281
_version_	1781783403037720576

Feasibility of modulated optical deflection sensing in atomic force microscopy

Similar Items