Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

10.3762/bjnano.6.93

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Bibliographic Details
Main Authors: Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M
Other Authors: DEPT OF CHEMISTRY
Format: Article
Published: 2020
Subjects:
Atomic force microscopy
Carbon
Electron scattering
Silicon carbide
AFM
Dynamic atomic force microscopy
Electronic contributions
Room temperature
SiC
STM
Theoretical simulation
Tunneling current
Graphene
Online Access:https://scholarbank.nus.edu.sg/handle/10635/183611
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Institution: National University of Singapore

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https://scholarbank.nus.edu.sg/handle/10635/183611

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