Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

10.3762/bjnano.6.93

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Bibliographic Details
Main Authors:	Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M
Other Authors:	DEPT OF CHEMISTRY
Format:	Article
Published:	2020
Subjects:	Atomic force microscopy Carbon Electron scattering Silicon carbide AFM Dynamic atomic force microscopy Electronic contributions Room temperature SiC STM Theoretical simulation Tunneling current Graphene
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/183611
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-183611
record_format	dspace
spelling	sg-nus-scholar.10635-1836112023-09-21T08:12:08Z Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature Telychko, M Berger, J Majzik, Z Jelínek, P Svec, M DEPT OF CHEMISTRY Atomic force microscopy Carbon Electron scattering Silicon carbide AFM Dynamic atomic force microscopy Electronic contributions Room temperature SiC STM Theoretical simulation Tunneling current Graphene 10.3762/bjnano.6.93 Beilstein Journal of Nanotechnology 6 1 901-906 2020-11-17T08:54:57Z 2020-11-17T08:54:57Z 2015 Article Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M (2015). Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature. Beilstein Journal of Nanotechnology 6 (1) : 901-906. ScholarBank@NUS Repository. https://doi.org/10.3762/bjnano.6.93 21904286 https://scholarbank.nus.edu.sg/handle/10635/183611 Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ Unpaywall 20201031
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Atomic force microscopy Carbon Electron scattering Silicon carbide AFM Dynamic atomic force microscopy Electronic contributions Room temperature SiC STM Theoretical simulation Tunneling current Graphene
spellingShingle	Atomic force microscopy Carbon Electron scattering Silicon carbide AFM Dynamic atomic force microscopy Electronic contributions Room temperature SiC STM Theoretical simulation Tunneling current Graphene Telychko, M Berger, J Majzik, Z Jelínek, P Svec, M Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
description	10.3762/bjnano.6.93
author2	DEPT OF CHEMISTRY
author_facet	DEPT OF CHEMISTRY Telychko, M Berger, J Majzik, Z Jelínek, P Svec, M
format	Article
author	Telychko, M Berger, J Majzik, Z Jelínek, P Svec, M
author_sort	Telychko, M
title	Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
title_short	Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
title_full	Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
title_fullStr	Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
title_full_unstemmed	Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
title_sort	graphene on sic(0001) inspected by dynamic atomic force microscopy at room temperature
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/183611
_version_	1779153099384946688

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

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