Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

10.3762/bjnano.6.93

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Bibliographic Details
Main Authors:	Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M
Other Authors:	DEPT OF CHEMISTRY
Format:	Article
Published:	2020
Subjects:	Atomic force microscopy Carbon Electron scattering Silicon carbide AFM Dynamic atomic force microscopy Electronic contributions Room temperature SiC STM Theoretical simulation Tunneling current Graphene
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/183611
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Institution:	National University of Singapore

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