Label-free deeply subwavelength optical microscopy

• المؤلفون الرئيسيون: Pu, T., Ou, J. Y., Papasimakis, N., Zheludev, Nikolay I.
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Science::Physics; Deep Learning; Optical Microscopy
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/143948
• المؤسسة: Nanyang Technological University

We report the experimental demonstration of deeply subwavelength far-field optical microscopy of unlabeled samples. We beat the ∼λ/2 diffraction limit of conventional optical microscopy several times over by recording the intensity pattern of coherent light scattered from the object into the far-fie...