Label-free deeply subwavelength optical microscopy

• Main Authors: Pu, T., Ou, J. Y., Papasimakis, N., Zheludev, Nikolay I.
• 其他作者: School of Physical and Mathematical Sciences
• 格式: Article
• 語言: English
• 出版: 2020
• 主題: Science::Physics; Deep Learning; Optical Microscopy
• 在線閱讀: https://hdl.handle.net/10356/143948

We report the experimental demonstration of deeply subwavelength far-field optical microscopy of unlabeled samples. We beat the ∼λ/2 diffraction limit of conventional optical microscopy several times over by recording the intensity pattern of coherent light scattered from the object into the far-fie...