Data processing and analytics in L-I-V test of VCSEL

L-I-V test is commonly used in semiconductor industry to exam the wafer products’ quality. This test assesses every individual VCSEL (Vertical Cavity Surface Emitting Laser) on the wafer slice with some quantities showing its lasing characteristics when electrically supplied. A software named “LIVCa...

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Bibliographic Details
Main Author: Xu, Zhengyang
Other Authors: Liu Linbo
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2020
Subjects:
Online Access:https://hdl.handle.net/10356/145081
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Institution: Nanyang Technological University
Language: English

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