Data processing and analytics in L-I-V test of VCSEL

• Main Author: Xu, Zhengyang
• Other Authors: Liu Linbo
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2020
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/145081
• Institution: Nanyang Technological University

L-I-V test is commonly used in semiconductor industry to exam the wafer products’ quality. This test assesses every individual VCSEL (Vertical Cavity Surface Emitting Laser) on the wafer slice with some quantities showing its lasing characteristics when electrically supplied. A software named “LIVCa...