Exploiting the categorical reliability difference for binary classification

• المؤلفون الرئيسيون: Sun, Lei, Toh, Kar-Ann, Chen, Badong, Lin, Zhiping
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Electrical and electronic engineering; Binary Classification; Classification Algorithm
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/145211

In binary pattern classification, the reliabilities of statistics obtained from the samples of the two categories are generally different. When the statistics are used for modeling a classifier, such reliability difference could impact the generalization performance. We formulate a disparity index t...