Exploiting the categorical reliability difference for binary classification

• Main Authors: Sun, Lei, Toh, Kar-Ann, Chen, Badong, Lin, Zhiping
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2020
• Subjects: Engineering::Electrical and electronic engineering; Binary Classification; Classification Algorithm
• Online Access: https://hdl.handle.net/10356/145211
• Institution: Nanyang Technological University

In binary pattern classification, the reliabilities of statistics obtained from the samples of the two categories are generally different. When the statistics are used for modeling a classifier, such reliability difference could impact the generalization performance. We formulate a disparity index t...