Exploiting the categorical reliability difference for binary classification

In binary pattern classification, the reliabilities of statistics obtained from the samples of the two categories are generally different. When the statistics are used for modeling a classifier, such reliability difference could impact the generalization performance. We formulate a disparity index t...

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Main Authors: Sun, Lei, Toh, Kar-Ann, Chen, Badong, Lin, Zhiping
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2020
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在線閱讀:https://hdl.handle.net/10356/145211
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機構: Nanyang Technological University
語言: English

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