Exploiting the categorical reliability difference for binary classification

• Main Authors: Sun, Lei, Toh, Kar-Ann, Chen, Badong, Lin, Zhiping
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2020
• 主題: Engineering::Electrical and electronic engineering; Binary Classification; Classification Algorithm
• 在線閱讀: https://hdl.handle.net/10356/145211

In binary pattern classification, the reliabilities of statistics obtained from the samples of the two categories are generally different. When the statistics are used for modeling a classifier, such reliability difference could impact the generalization performance. We formulate a disparity index t...