The prevalence of lower eyelid epiblepharon and its association with refractive errors in Chinese preschool children : a cross-sectional study

• Main Authors: Zhuo, Deyi, Chen, Si, Ren, Xiaofang, Wang, Bingsong, Liu, Linbo, Xiao, Lin
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2021
• 主題: Engineering::Electrical and electronic engineering; Lower Eyelid Epiblepharon; Astigmatism
• 在線閱讀: https://hdl.handle.net/10356/146223

Background: To assess the prevalence and demographics of lower eyelid epiblepharon in Chinese preschool children and to evaluate its association with refractive errors. Methods: In this population-based, cross-sectional study, a total of 3170 children aged 3 to 6 years from Beijing, China underwent...