Defect-GAN : high-fidelity defect synthesis for automated defect inspection

• Main Authors: Zhang, Gongjie, Cui, Kaiwen, Hung, Tzu-Yi, Lu, Shijian
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2021
• Subjects: Engineering::Computer science and engineering; Defect Inspection; Image Synthesis
• Online Access: https://hdl.handle.net/10356/146285
• Institution: Nanyang Technological University

Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially when we adopt deep neural networks for this task. This pape...