Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device

Memory is an essential component of the electronic device. Today, nearly 30% area of a chip is taken by different types of memory. Recently, non-volatile memory is becoming more and more popular. For example, the so-called solid-state drive (SSD) is based on non-volatile flash memory, which is do...

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Main Author: Lian, Jie
Other Authors: Chen Tupei
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2021
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Online Access:https://hdl.handle.net/10356/149587
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-1495872023-07-04T16:27:13Z Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device Lian, Jie Chen Tupei School of Electrical and Electronic Engineering EChenTP@ntu.edu.sg Engineering::Electrical and electronic engineering::Microelectronics Memory is an essential component of the electronic device. Today, nearly 30% area of a chip is taken by different types of memory. Recently, non-volatile memory is becoming more and more popular. For example, the so-called solid-state drive (SSD) is based on non-volatile flash memory, which is dominating the memory industry. As the critical dimension (CD) keeps on reducing, it’s hard for us to overcome the bottleneck of photolithography technology to fabricate the smaller device. New structures are introduced to further increase the device density, such as Multilevel cell (MLC), Tri-level cell (TLC), Qual-level cell (QLC), and even 3D structures. But the structure of the flash memory will still restrict further development. A novel nonvolatile memory – Resistive Random-Access Memory (RRAM) has been investigated for a long time. RRAM is considered a promising candidate for next-generation memory due to its non-volatile property, simple structure, high density, low power consumption, fast speed, multi-bit storage, and CMOS process capability. This dissertation will first review some basic concepts about RRAM and operation principles, conduction mechanisms, and typical materials and structures. Then some compact models are introduced, including two famous models from Stanford University and Peking University, respectively. These models are implanted in LTspice with two methods in this dissertation. After that, some simulations are done based on the models. Two models in the LTspice are flexible and good enough for us to do further simulations. Many other details can be added to describe the complicated mechanisms and some variations for future work, which can give us a better simulation result. Besides the one RRAM component simulation, 1T1R memory cell and memory array simulation can be done with LTspice based on the models we created in this dissertation. Master of Science (Electronics) 2021-06-08T08:32:53Z 2021-06-08T08:32:53Z 2021 Thesis-Master by Coursework Lian, J. (2021). Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device. Master's thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149587 https://hdl.handle.net/10356/149587 en application/pdf Nanyang Technological University
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle Engineering::Electrical and electronic engineering::Microelectronics
Lian, Jie
Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
description Memory is an essential component of the electronic device. Today, nearly 30% area of a chip is taken by different types of memory. Recently, non-volatile memory is becoming more and more popular. For example, the so-called solid-state drive (SSD) is based on non-volatile flash memory, which is dominating the memory industry. As the critical dimension (CD) keeps on reducing, it’s hard for us to overcome the bottleneck of photolithography technology to fabricate the smaller device. New structures are introduced to further increase the device density, such as Multilevel cell (MLC), Tri-level cell (TLC), Qual-level cell (QLC), and even 3D structures. But the structure of the flash memory will still restrict further development. A novel nonvolatile memory – Resistive Random-Access Memory (RRAM) has been investigated for a long time. RRAM is considered a promising candidate for next-generation memory due to its non-volatile property, simple structure, high density, low power consumption, fast speed, multi-bit storage, and CMOS process capability. This dissertation will first review some basic concepts about RRAM and operation principles, conduction mechanisms, and typical materials and structures. Then some compact models are introduced, including two famous models from Stanford University and Peking University, respectively. These models are implanted in LTspice with two methods in this dissertation. After that, some simulations are done based on the models. Two models in the LTspice are flexible and good enough for us to do further simulations. Many other details can be added to describe the complicated mechanisms and some variations for future work, which can give us a better simulation result. Besides the one RRAM component simulation, 1T1R memory cell and memory array simulation can be done with LTspice based on the models we created in this dissertation.
author2 Chen Tupei
author_facet Chen Tupei
Lian, Jie
format Thesis-Master by Coursework
author Lian, Jie
author_sort Lian, Jie
title Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
title_short Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
title_full Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
title_fullStr Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
title_full_unstemmed Simulation of resistive random-access memory (RRAM) : SPICE modelling of RRAM device
title_sort simulation of resistive random-access memory (rram) : spice modelling of rram device
publisher Nanyang Technological University
publishDate 2021
url https://hdl.handle.net/10356/149587
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