Delayered IC image analysis with template‐based tanimoto convolution and morphological decision

• المؤلفون الرئيسيون: Cheng, Deruo, Shi, Yiqiong, Lin, Tong, Gwee, Bah Hwee, Toh, Kar‐Ann
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2021
• الموضوعات: Engineering::Electrical and electronic engineering::Integrated circuits; Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision; Hardware Security; Segmentation
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/152375

Supervised machine learning techniques are being pursued for delayered Integrated Circuit (IC) image analysis. However, repetitive data labelling and model training are required for every image set with the supervised techniques. In view of the large scale of IC image set being analysed, techniques...