Development of resistive random access memory for next-generation embedded non-volatile memory application

Resistive random access memory (RRAM) is a promising candidate for the next-generation non-volatile memory owing to its simple structure, fast read/write speed, low power consumption, high memory density, and complementary metal oxide semiconductor (CMOS) compatibility. However, many challenges such...

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Bibliographic Details
Main Author: Sun, Jianxun
Other Authors: Chen Tupei
Format: Thesis-Doctor of Philosophy
Language:English
Published: Nanyang Technological University 2021
Subjects:
Online Access:https://hdl.handle.net/10356/152482
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Institution: Nanyang Technological University
Language: English