Measuring crystal orientation from etched surfaces via directional reflectance microscopy

• Main Authors: Wang, Xiaogang, Gao, Shubo, Jain, Ekta, Gaskey, Bernard, Seita, Matteo
• Other Authors: School of Mechanical and Aerospace Engineering
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering::Materials; Diffraction; Mapping
• Online Access: https://hdl.handle.net/10356/153633
• Institution: Nanyang Technological University

Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive...