Measuring crystal orientation from etched surfaces via directional reflectance microscopy
Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive...
Saved in:
Main Authors: | Wang, Xiaogang, Gao, Shubo, Jain, Ekta, Gaskey, Bernard, Seita, Matteo |
---|---|
Other Authors: | School of Mechanical and Aerospace Engineering |
Format: | Article |
Language: | English |
Published: |
2021
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/153633 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy
by: Zhu, Chenyang, et al.
Published: (2022) -
Optical characterization of grain orientation in crystalline materials
by: Gaskey, Bernard, et al.
Published: (2022) -
An automated and unbiased grain segmentation method based on directional reflectance microscopy
by: Wittwer, Mallory, et al.
Published: (2022) -
Optical orientation mapping of additively manufactured alloys using directional reflectance microscopy
by: Matteo, Seita, et al.
Published: (2023) -
Combining polarized light microscopy with machine learning to map crystallographic textures on cubic metals
by: Wang, Xiaogang, et al.
Published: (2023)