Advanced crystallography measurements by dIrectional reflectance microscopy

Characterizing crystallographic orientation is crucial for understanding the structure-property relationships in crystalline solids. This information is used in academia, to interpret the behavior of existing materials and design new ones, as well as in industry, to qualify the performance of engine...

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Bibliographic Details
Main Author: Zhu, Chenyang
Other Authors: Xiao Zhongmin
Format: Thesis-Doctor of Philosophy
Language:English
Published: Nanyang Technological University 2024
Subjects:
Online Access:https://hdl.handle.net/10356/181518
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Institution: Nanyang Technological University
Language: English