Advanced crystallography measurements by dIrectional reflectance microscopy
Characterizing crystallographic orientation is crucial for understanding the structure-property relationships in crystalline solids. This information is used in academia, to interpret the behavior of existing materials and design new ones, as well as in industry, to qualify the performance of engine...
Saved in:
Main Author: | Zhu, Chenyang |
---|---|
Other Authors: | Xiao Zhongmin |
Format: | Thesis-Doctor of Philosophy |
Language: | English |
Published: |
Nanyang Technological University
2024
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/181518 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Crystallography and the World of Symmetry
by: Chatterjee, Sanat K.
Published: (2017) -
Synthesis of metal complex crystals of bisisoquenolines derivatives and their x-ray crystallography
by: Teng, Jun Boon.
Published: (2010) -
Optical orientation mapping of additively manufactured alloys using directional reflectance microscopy
by: Matteo, Seita, et al.
Published: (2023) -
A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy
by: Zhu, Chenyang, et al.
Published: (2022) -
CHARACTERISATION OF NOVEL BACTERIAL FILAMENT SYSTEMS AND THEIR POTENTIAL AS ANTIBIOTIC TARGETS
by: LEE LIN JIE
Published: (2017)