Direct ray tracing for low energy electron microscopy

Direct ray tracing for low energy electron microscopy

Master's

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Bibliographic Details
Main Author: DING YU
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2011
Subjects:
Direct ray tracing; Low voltage SEM; Electron spectroscopy; Time-of-flight emission microscope; Dynamic chromatic aberration correction; Drift tube
Online Access:http://scholarbank.nus.edu.sg/handle/10635/23042
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Institution: National University of Singapore
Language: English

Internet

http://scholarbank.nus.edu.sg/handle/10635/23042

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