Design and development of gate driver for short circuit fault detection in wide bandgap (WBG) devices

• المؤلف الرئيسي: Goh, Sheue Ling
• مؤلفون آخرون: Wong Kin Shun, Terence
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2022
• الموضوعات: Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/158097

In power converters, short-circuit faults are the most common cause of failure. Short-Circuit (SC) detection and protection methods have been developed for silicon (Si) devices, such as Si Insulated Gate Bipolar Transistors (IGBT) or Si Metal Oxide Field Effect Transistors (MOSFET). The emergen...