Design and development of gate driver for short circuit fault detection in wide bandgap (WBG) devices

• Main Author: Goh, Sheue Ling
• Other Authors: Wong Kin Shun, Terence
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2022
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/158097
• Institution: Nanyang Technological University

In power converters, short-circuit faults are the most common cause of failure. Short-Circuit (SC) detection and protection methods have been developed for silicon (Si) devices, such as Si Insulated Gate Bipolar Transistors (IGBT) or Si Metal Oxide Field Effect Transistors (MOSFET). The emergen...