Towards more efficient security inspection via deep learning: a task-driven x-ray image cropping scheme

X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object...

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Main Authors: Nguyen, Hong Duc, Cai, Rizhao, Zhao, Heng, Kot, Alex Chichung, Wen, Bihan
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2022
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在線閱讀:https://hdl.handle.net/10356/160540
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機構: Nanyang Technological University
語言: English