Towards more efficient security inspection via deep learning: a task-driven x-ray image cropping scheme

• المؤلفون الرئيسيون: Nguyen, Hong Duc, Cai, Rizhao, Zhao, Heng, Kot, Alex Chichung, Wen, Bihan
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2022
• الموضوعات: Engineering::Electrical and electronic engineering; X-Ray Imaging; Objective Detection
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/160540

X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object...