Towards more efficient security inspection via deep learning: a task-driven x-ray image cropping scheme

• Main Authors: Nguyen, Hong Duc, Cai, Rizhao, Zhao, Heng, Kot, Alex Chichung, Wen, Bihan
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2022
• Subjects: Engineering::Electrical and electronic engineering; X-Ray Imaging; Objective Detection
• Online Access: https://hdl.handle.net/10356/160540
• Institution: Nanyang Technological University

X-ray imaging machines are widely used in border control checkpoints or public transportation, for luggage scanning and inspection. Recent advances in deep learning enabled automatic object detection of X-ray imaging results to largely reduce labor costs. Compared to tasks on natural images, object...