Deep learning in optical metrology: a review

Deep learning in optical metrology: a review

With the advances in scientific foundations and technological implementations, optical metrology has become versatile problem-solving backbones in manufacturing, fundamental research, and engineering applications, such as quality control, nondestructive testing, experimental mechanics, and biomedici...

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Bibliographic Details
Main Authors: Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian
Other Authors: School of Computer Science and Engineering
Format: Article
Language:English
Published: 2022
Subjects:
Engineering::Computer science and engineering
Deep Neural Networks
Digital Storage
Online Access:https://hdl.handle.net/10356/160720
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Institution: Nanyang Technological University
Language: English

Internet

https://hdl.handle.net/10356/160720

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